XRM offers detailing of microstructures
14 September 2018
3D X-ray microscopy (XRM) is a non-destructive imaging technique that provides internal three-dimensional (3D) information in extraordinary detail for specimens, samples, equipment and parts. It encompasses a range of length scales, down to the submicron scale, and generates manipulable data, enabling quantitative analysis of 3D microstructures that it would not be possible to visualise using standard X-ray tomography or microfocus X-ray.
This ability to deliver high resolution and contrast in three dimensions means that previously unseen features and flaws can be revealed in millimetres down to micrometres, as well as offering the opportunity to study samples in situ to examine how a microstructure changes over time, known as four-dimensional (4D) imaging.
As a result of these attributes, XRM is highly relevant to a number of industries, because it is a flexible, in-depth analysis process that provides highly precise information.
TWI offers a bespoke 3D X-ray microscopy service managed by non-destructive testing experts who bring a wide range of practical experience across many sectors to clients’ projects, and use the latest equipment for scanning, inspection, analysis and interpretation.
TWI uses superior, submicron X-ray imaging output data which is produced and manipulated in-house using the Zeiss Xradia Versa 520. This compositional contrast system has a true spatial resolution of 0.7μm and a minimum voxel size of 70nm. Other high specification features include: accuracy to 160kV transmission nano-focus X-ray source, a wide field mode and vertical stitching, high-aspect-ratio tomography (HART) mode for flat samples, and non-destructive interior tomography.